Varian introduces digital X-ray detector for medical, and semiconductor
markets
18 July 2006 Salt Lake City, USA. Varian Medical Systems, Inc.
(NYSE:VAR) has introduced the PaxScan 1313, designed for low-cost,
high-quality X-ray imaging. Optimized for use in dental and orthopaedic
imaging and semiconductor inspection systems, it offers a 13 x 13 cm imaging
area and produces up to 30 images per second. The PaxScan 1313 is designed
to replace the six-inch image intensifiers currently used in many
orthopaedic and dental imaging systems. "Image intensifier tubes offer only
8-bit depth, they degrade over time, and they must be replaced frequently in
some cases, raising their cost," Okamoto points out. "Image quality is
better with the PaxScan detector. It generates images of up to 16,000 shades
of gray thanks to a 14-bit depth ADC (analog-to-digital) converter, giving
it the highest contrast resolution available for a panel of this size. With
higher contrast resolution, clinicians can see more detail. A flat panel
imager also doesn't exhibit the pin cushion distortion characteristic of
image intensifier tubes." The panel's 127-micron pixel pitch — one of the
smallest in the industry — results in a high signal-to-noise ratio, yielding
high-quality images with enhanced contrast resolution and no distortion
anywhere in the imaging area. For medical imaging applications, the panel
features an efficient Caesium Iodide (CsI) scintillator optimized for
scanning at 80-90 kilovolts (kV) in order to minimize the X-ray dose to the
patient.
For semiconductor inspection applications, the PaxScan 1313 is a durable
flat-panel digital image detector with the processing speed needed to
inspect thousands of chips per hour. According to Okamoto, it is capable of
high-speed screening of ball-grid-arrays (BGA) and lead-grid-aArrays (LGA).
The panel utilizes amorphous (non-crystalline) silicon, which makes it more
resilient than competing CMOS (complementary metal oxide semiconductor)
wafer detectors, and capable of lasting up to five times longer, even in
highly demanding round-the-clock semiconductor screening operations."
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